Moreover, the planned Power Electronics Reliability Lab (PERL) aims to identify, characterize, perform accelerated lifetime testing (ALT) and reliability assessments of various power electronics (PE) converters & components, including power semiconductor switches (i.e., Si, SiC and GaN), diodes, heatsinks, gate drivers, controllers, and battery management systems to name a few. PERL facilities with state-of-the-art infrastructure to systematically perform accelerated lifetime testing (ALT) on power electronics converters/components according to real-life mission profiles and bring a systematic approach to use ALT in component and subsystem reliability characterization. PERL’s features and services are:
- Contemporaneous testing of up to 12 IGBT, Diode or MOSFET (6 half-bridge power modules);
- Temperature cycling tests on the PE device/heatsink setup in Tmin/Tmax=-40/+125oC ;
- Thermal impedance studies of semiconductors (1200V/1700V, 300A);
- Accelerated lifetime testing up to 1200A load current;
- Powered tests on power electronics systems and their control systems, the power is limited by the available power supply (up to 250 kW).
[InfraREL-PE Infra project is a part of PERL at MOBI core lab, co-funded and supported by Flanders make, a strategic research center for the manufacturing industry]
Interested? Got questions? Please do not hesitate to contact us!
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EPOWERS is a part of MOBI Core Lab @ Flanders Make